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Statistical Process Control For Quality Improvement- Hardcover Version - CRC Press Book
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More filters. Sort order. Arturo Morales rated it it was amazing Feb 11, Richard rated it liked it Feb 20, Lula added it Apr 29, Kate marked it as to-read Jun 29, Warren marked it as to-read Oct 23, Masoud Sateie marked it as to-read Jul 13, Sebastian Lucano marked it as to-read Jan 28, Matt marked it as to-read Nov 15, Larry Campbell marked it as to-read Nov 26, Prince Arhaan marked it as to-read Jul 05, There are no discussion topics on this book yet. About James R. James R. Time series analysis: forecasting and control. Holden-Day, San Fransisco, Some recent advances in forecasting and control, Part II.
Applied Statistics ; 23 2 — Chartfield C. The analysis of time series: An introduction.
Engineering Process Control: A Review
London: Chapman and Hall, Time series analysis, forecasting and control. Forecasting and time series analysis. New York: McGraw Hill, Ljung L System identification: Theory for users 2nd edition.
Upper Saddle River, NJ. Ljung L, Soderstrom T. Theory and practice of recursive identification. Time series: Theory and methods. Berlin: Springer, A graphical procedure for determining non stationary in time series.
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Technometrics ; 64— Optimal adjustment in the presence of deterministic process drift and random adjustment error.here
Statistical Process Control: The Deming Paradigm and Beyond
Technometrics ; — Grubbs FE. An optimal procedure for setting machines or adjusting processes. Sullo P, Vandevan M. Optimal adjustment strategies for a process with run to run variation and 0—1 quality loss. IIE Trans.
Pan R. Scheduling methods for the statistical setup adjustment problem. Del Castillo, Hurwitz A. Run to run process control: A review and some extensions.
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Journal of Quality Technology ; 33 2 — Run to run control in semiconductor manufacturing. C, Ingolfsson A, Sachs E. Stability and sensitivity of a EWMA controller. Supervisory run to run control of a polysilicon gate etche using in situ ellipsometry. IEEE Trans. Semiconductor Manufact.
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Del Castillo E. Statistical process adjustment for quality control. Long run and transient analysis of a double EWMA feedback controller. IIE Transactions ; 31 12 — Statistical design of double EWMA controller. Applied Stochastic Models in Business and Industry b; 18 3 — Sample size determination for achieving asymptotic stability of a double EWMA control scheme. Some properties of EWMA feedback quality adjustment scheme for drifting disturbances.